Fig. 5
From: A Computational Study of Spike Time Reliability in Two Types of Threshold Dynamics
Reliability is insensitive to the frequency content of the noise signal when ISIs are long, shown for Type II. Test noise signals are generated by connecting distinct samples of spike-evoking epochs (SEEs) with intervals of samples that are known to be incapable of generating a spike. The power spectrum for each signal is plotted in the right panel. From top to bottom, the peak frequency component is located at 0.00641 kHz in a, 0.004 kHz in b, 0.01 kHz in c, and is insignificant in d. The values of R are calculated with data collected from 100 trials, each containing more than 45 spikes